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XRF-analysaattorin tarkkuuden ja näytteenottotaajuuden vaikutus säädön hyvyyteen vaahdotusprosessissa
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Helsinki University of Technology |
Master's thesis
Electronic archive copy is available via Aalto Thesis Database.
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Major/Subject
Mcode
Kem-90
Degree programme
Language
fi
Pages
xii + 127 s. + liitt.
Series
Description
Supervisor
Jämsä-Jounela, Sirkka-LiisaThesis advisor
Kongas, MattiSaloheimo, Kari